@misc{indiciae99ca9baf2134,
  title = {High-throughput density characterization of combinatorial thin films using x-ray reflectivity},
  author = {Addamane, Sadhvikas Jayachandra and Dorman, Kyle Rhys and Desai, Saaketh and Rodriguez, Mark Andrew and Heile, Jonathan Daniel and Wampler, William R. and Dingreville, Remi Philippe Michel and Boyce, Brad Lee and Adams, David P.},
  year = {2024},
  doi = {10.2172/2585826},
  url = {https://www.osti.gov/biblio/2585826},
  note = {Source identifier: 2585826}
}