TY  - RPRT
TI  - High-throughput density characterization of combinatorial thin films using x-ray reflectivity
AU  - Addamane, Sadhvikas Jayachandra
AU  - Dorman, Kyle Rhys
AU  - Desai, Saaketh
AU  - Rodriguez, Mark Andrew
AU  - Heile, Jonathan Daniel
AU  - Wampler, William R.
AU  - Dingreville, Remi Philippe Michel
AU  - Boyce, Brad Lee
AU  - Adams, David P.
PY  - 2024
DO  - 10.2172/2585826
UR  - https://www.osti.gov/biblio/2585826
ID  - 2585826
ER  -