@misc{indiciae4b3aeca2f94e,
  title = {A rapid, pulsed laser testing approach for single event latch-up screening in microelectronics},
  author = {Andrus, Liam Padraic},
  year = {2024},
  doi = {10.2172/2586273},
  url = {https://www.osti.gov/biblio/2586273},
  note = {Source identifier: 2586273}
}