TY  - RPRT
TI  - A rapid, pulsed laser testing approach for single event latch-up screening in microelectronics
AU  - Andrus, Liam Padraic
PY  - 2024
DO  - 10.2172/2586273
UR  - https://www.osti.gov/biblio/2586273
ID  - 2586273
ER  -