@misc{indiciae90a9eaee2fd9,
  title = {Kelvin probe force microscopy under ambient conditions},
  author = {Zahmatkeshsaredorahi, Amirhossein [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:0009000358704027) and Millan-Solsona, Ruben [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000309127246) and Jakob, Devon S. [Lehigh Univ., Bethlehem, PA (United States)] and Collins, Liam [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000349469195) and Xu, Xiaoji G. [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:0000000308475871)},
  year = {2025},
  doi = {10.1038/s43586-025-00424-9},
  url = {https://www.osti.gov/biblio/2586927},
  note = {Source identifier: 2586927}
}