TY  - RPRT
TI  - Kelvin probe force microscopy under ambient conditions
AU  - Zahmatkeshsaredorahi, Amirhossein [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:0009000358704027)
AU  - Millan-Solsona, Ruben [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000309127246)
AU  - Jakob, Devon S. [Lehigh Univ., Bethlehem, PA (United States)]
AU  - Collins, Liam [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)] (ORCID:0000000349469195)
AU  - Xu, Xiaoji G. [Lehigh Univ., Bethlehem, PA (United States)] (ORCID:0000000308475871)
PY  - 2025
DO  - 10.1038/s43586-025-00424-9
UR  - https://www.osti.gov/biblio/2586927
ID  - 2586927
ER  -