@misc{indiciaec2435953a791,
  title = {Deep learning of structural morphology imaged by scanning X-ray diffraction microscopy},
  author = {Luo, Aileen [Cornell Univ., Ithaca, NY (United States)] and Zhou, Tao [Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)] and Holt, Martin V. [Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)] and Singer, Andrej [Cornell Univ., Ithaca, NY (United States)] and Cherukara, Mathew J. [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)]},
  year = {2025},
  doi = {10.1038/s41598-025-97183-0},
  url = {https://www.osti.gov/biblio/2587357},
  note = {Source identifier: 2587357}
}