TY  - RPRT
TI  - Deep learning of structural morphology imaged by scanning X-ray diffraction microscopy
AU  - Luo, Aileen [Cornell Univ., Ithaca, NY (United States)]
AU  - Zhou, Tao [Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)]
AU  - Holt, Martin V. [Argonne National Laboratory (ANL), Argonne, IL (United States). Center for Nanoscale Materials (CNM)]
AU  - Singer, Andrej [Cornell Univ., Ithaca, NY (United States)]
AU  - Cherukara, Mathew J. [Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)]
PY  - 2025
DO  - 10.1038/s41598-025-97183-0
UR  - https://www.osti.gov/biblio/2587357
ID  - 2587357
ER  -