@misc{indiciaebc6f07c681ae,
  title = {Synthesis‐Related Nanoscale Defects in Mo‐Based Janus Monolayers Revealed by Cross‐Correlated AFM and TERS Imaging},
  author = {Zhang, Tianyi [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] (ORCID:0000000289983837) and Krayev, Andrey [HORIBA Scientific, Novato, CA (United States)] and Yang, Tilo H. [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Mao, Nannan [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Hoang, Lauren [Stanford Univ., CA (United States)] and Wang, Zhien [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Liu, Hongwei [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Peng, Yu‐Ren [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); National Tsing Hua Univ., Hsinchu (Taiwan)] and Zhu, Yunyue [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Zheng, Xudong [Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)] and Isotta, Eleonora [Department of Materials Science and Engineering Northwestern University 2220 Campus Drive Evanston IL 60208 USA] and Kira, Maria E. [Departamento de Física Universidade Federal de Minas Gerais Av. Antônio Carlos, 6627, Pampulha Belo Horizonte Minas Gerais 31270‐901 Brazil] and Righi, Ariete [Departamento de Física Universidade Federal de Minas Gerais Av. Antônio Carlos, 6627, Pampulha Belo Horizonte Minas Gerais 31270‐901 Brazil] and Pimenta, Marcos A. [Departamento de Física Universidade Federal de Minas Gerais Av. Antônio Carlos, 6627, Pampulha Belo Horizonte Minas Gerais 31270‐901 Brazil] and Chueh, Yu‐Lun [Department of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan] and Pop, Eric [Department of Electrical Engineering Stanford University Stanford CA 94305 USA; Department of Materials Science \& Engineering Stanford University Stanford CA 94305 USA] and Mannix, Andrew J. [Department of Materials Science \& Engineering Stanford University Stanford CA 94305 USA] and Kong, Jing [Department of Electrical Engineering and Computer Science Massachusetts Institute of Technology Cambridge MA 02139 USA] (ORCID:0000000305511208)},
  year = {2025},
  doi = {10.1002/smll.202504742},
  url = {https://www.osti.gov/biblio/2865162},
  note = {Source identifier: 2865162}
}