@misc{indiciae3e0528a9335d,
  title = {In Situ Tracking of Nonthermal Plasma Etching of ZIF-8 Films},
  author = {Dorneles de Mello, Matheus [University of Delaware, Newark, DE (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000265749421) and Ahmad, Mueed [Brookhaven National Laboratory (BNL), Upton, NY (United States); Stony Brook University, NY (United States)] and Lee, Dennis T. [Johns Hopkins University, Baltimore, MD (United States)] (ORCID:0000000219762852) and Dimitrakellis, Panagiotis [University of Delaware, Newark, DE (United States)] and Miao, Yurun [Johns Hopkins University, Baltimore, MD (United States)] (ORCID:0000000164298297) and Zheng, Weiqing [University of Delaware, Newark, DE (United States)] and Nykypanchuk, Dmytro [Brookhaven National Laboratory (BNL), Upton, NY (United States)] and Vlachos, Dionisios G. [University of Delaware, Newark, DE (United States)] (ORCID:0000000267958403) and Tsapatsis, Michael [University of Delaware, Newark, DE (United States); Johns Hopkins University, Baltimore, MD (United States); Johns Hopkins University, Laurel, MD (United States)] (ORCID:0000000156103525) and Boscoboinik, Jorge Anibal [University of Delaware, Newark, DE (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000250907079)},
  year = {2022},
  doi = {10.1021/acsami.2c00259},
  url = {https://www.osti.gov/biblio/2875653},
  note = {Source identifier: 2875653}
}