TY  - RPRT
TI  - In Situ Tracking of Nonthermal Plasma Etching of ZIF-8 Films
AU  - Dorneles de Mello, Matheus [University of Delaware, Newark, DE (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000265749421)
AU  - Ahmad, Mueed [Brookhaven National Laboratory (BNL), Upton, NY (United States); Stony Brook University, NY (United States)]
AU  - Lee, Dennis T. [Johns Hopkins University, Baltimore, MD (United States)] (ORCID:0000000219762852)
AU  - Dimitrakellis, Panagiotis [University of Delaware, Newark, DE (United States)]
AU  - Miao, Yurun [Johns Hopkins University, Baltimore, MD (United States)] (ORCID:0000000164298297)
AU  - Zheng, Weiqing [University of Delaware, Newark, DE (United States)]
AU  - Nykypanchuk, Dmytro [Brookhaven National Laboratory (BNL), Upton, NY (United States)]
AU  - Vlachos, Dionisios G. [University of Delaware, Newark, DE (United States)] (ORCID:0000000267958403)
AU  - Tsapatsis, Michael [University of Delaware, Newark, DE (United States); Johns Hopkins University, Baltimore, MD (United States); Johns Hopkins University, Laurel, MD (United States)] (ORCID:0000000156103525)
AU  - Boscoboinik, Jorge Anibal [University of Delaware, Newark, DE (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000250907079)
PY  - 2022
DO  - 10.1021/acsami.2c00259
UR  - https://www.osti.gov/biblio/2875653
ID  - 2875653
ER  -