TY  - RPRT
TI  - Thick graded interfaces increase wear resistance in Ti/TiN nanolayered thin films
AU  - Cheng, Justin Y. [Univ. of Minnesota, Minneapolis, MN (United States)] (ORCID:0000000223391142)
AU  - Hamilton, Ashlie [Univ. of Minnesota, Minneapolis, MN (United States)]
AU  - Odlyzko, Michael [Univ. of Minnesota, Minneapolis, MN (United States)]
AU  - De Leo, Mauricio [Univ. of Minnesota, Minneapolis, MN (United States)] (ORCID:0000000223239757)
AU  - Baldwin, J. Kevin [Los Alamos National Laboratory (LANL), Los Alamos, NM (United States). Center for Integrated Nanotechnologies (CINT)]
AU  - Mara, Nathan A. [Univ. of Minnesota, Minneapolis, MN (United States)] (ORCID:0000000291354693)
PY  - 2025
DO  - 10.1016/j.tsf.2025.140653
UR  - https://www.osti.gov/biblio/2911682
ID  - 2911682
ER  -