TY  - RPRT
TI  - Micrometer: Micromechanics transformer for predicting full field mechanical responses of heterogeneous materials
AU  - Wang, Sifan [Yale Univ., New Haven, CT (United States)] (ORCID:0000000277216884)
AU  - Liu, Tong-Rui [Imperial College, London (United Kingdom)]
AU  - Sankaran, Shyam [Univ. of Pennsylvania, Philadelphia, PA (United States)]
AU  - Perdikaris, Paris [Univ. of Pennsylvania, Philadelphia, PA (United States)]
PY  - 2025
DO  - 10.1016/j.cma.2025.118373
UR  - https://www.osti.gov/biblio/2946311
ID  - 2946311
ER  -