@misc{indiciae2d0009dbe52c,
  title = {Templates for Risk Informed Assurance with Curvature Embeddings (TRACE)},
  author = {Patel, Lekha [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000335080672) and Allen, Garrett [Univ. of Washington, Seattle, WA (United States)] and Diaz, Candace Pauline [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] and Sleder, Steven Richard [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:000900095737017X) and Tran, Anh [Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)] and Mitchell, Scott A. [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000337104500)},
  year = {2025},
  doi = {10.2172/2997317},
  url = {https://www.osti.gov/biblio/2997317},
  note = {Source identifier: 2997317}
}