@misc{indiciae448fed8d87bd,
  title = {Characterization, Accelerated Life Testing, and Finite Element Modeling of Low Temperature Solder Wire Interconnect Degradation Mechanisms},
  author = {Hartley, James Yuan [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313764846) and Miller, David [National Renewable Energy Laboratory (NREL)] and Ulicná, Sona [National Renewable Energy Laboratory (NREL)] and Bosco, Nick [National Renewable Energy Laboratory (NREL)] and Hacke, Peter [National Renewable Energy Laboratory (NREL)]},
  year = {2025},
  doi = {10.1002/pip.70011},
  url = {https://www.osti.gov/biblio/2997341},
  note = {Source identifier: 2997341}
}