TY  - RPRT
TI  - Characterization, Accelerated Life Testing, and Finite Element Modeling of Low Temperature Solder Wire Interconnect Degradation Mechanisms
AU  - Hartley, James Yuan [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313764846)
AU  - Miller, David [National Renewable Energy Laboratory (NREL)]
AU  - Ulicná, Sona [National Renewable Energy Laboratory (NREL)]
AU  - Bosco, Nick [National Renewable Energy Laboratory (NREL)]
AU  - Hacke, Peter [National Renewable Energy Laboratory (NREL)]
PY  - 2025
DO  - 10.1002/pip.70011
UR  - https://www.osti.gov/biblio/2997341
ID  - 2997341
ER  -