@misc{indiciae78be640dac48,
  title = {Imaging the Acceptor Wave Function Anisotropy in Silicon},
  author = {Siegl, Manuel [Univ. College London (United Kingdom)] and Zanon, Julian [Eindhoven Univ. of Technology (Netherlands)] (ORCID:0000000228301361) and Sink, Joseph [Univ. of Iowa, Iowa City, IA (United States)] (ORCID:0000000249691565) and Rodrigues da Cruz, Adonai [Univ. of Iowa, Iowa City, IA (United States)] (ORCID:000000018719399X) and Hedgeland, Holly [Univ. College London (United Kingdom)] (ORCID:0000000337037942) and Curson, Neil J. [Univ. College London (United Kingdom)] (ORCID:0000000256610559) and Flatté, Michael E. [Eindhoven Univ. of Technology (Netherlands)] (ORCID:0000000150931549) and Schofield, Steven R. [Univ. College London (United Kingdom)] (ORCID:0000000207273015)},
  year = {2025},
  doi = {10.1021/acs.nanolett.5c02675},
  url = {https://www.osti.gov/biblio/2998292},
  note = {Source identifier: 2998292}
}