TY  - RPRT
TI  - Two-Dimensional Silk Crystal Films as Matrix Layer for High-Performance Microelectronics
AU  - Zhang, Shuai [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000301706470)
AU  - Tumeo, Antonino [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]
AU  - Shi, Chenyang [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]
AU  - Limaye, Ankur M. [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)] (ORCID:0000000194062584)
AU  - Gajaria, Dhruv Mayur [Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)]
PY  - 2025
DO  - 10.2172/2998651
UR  - https://www.osti.gov/biblio/2998651
ID  - 2998651
ER  -