TY  - RPRT
TI  - Advancing Additive Manufacturing Through Artificial Intelligence–Powered, High-Throughput, Nondestructive Characterization and Process Optimization
AU  - Ziabari, Amir [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Rahman, Obaidullah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Venkatakrishnan, Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Snow, Zackary [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Rossy, Andres Marquez [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Graham, Sarah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Rajas, Julio Ortega [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Nandwana, Peeyush [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Plotkowski, Alex [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Kirka, Michael [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Paquit, Vincent [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Dehoff, Ryan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Costa Santos, Edson [Carl Zeiss Industrial Metrology, LLC, Oberkochen (Germany)]
PY  - 2025
DO  - 10.2172/3000516
UR  - https://www.osti.gov/biblio/3000516
ID  - 3000516
ER  -