TY  - RPRT
TI  - Transport Enabled Gates with Integrated Photonics on a Surface Electrode Ion Trap
AU  - Hogle, Craig William
AU  - Sterk, Jonathan David
AU  - Stick, Daniel Lynn
PY  - 2024
DO  - 10.2172/3000640
UR  - https://www.osti.gov/biblio/3000640
ID  - 3000640
ER  -