@misc{indiciaebdd59dc43256,
  title = {SECONDARY ELECTRON YIELD MEASUREMENTS OF ENGINEERED SURFACE ROUGHNESS},
  author = {Pham, Minh and Goeke, Ronald S.},
  year = {2024},
  doi = {10.2172/3001137},
  url = {https://www.osti.gov/biblio/3001137},
  note = {Source identifier: 3001137}
}