TY  - RPRT
TI  - SECONDARY ELECTRON YIELD MEASUREMENTS OF ENGINEERED SURFACE ROUGHNESS
AU  - Pham, Minh
AU  - Goeke, Ronald S.
PY  - 2024
DO  - 10.2172/3001137
UR  - https://www.osti.gov/biblio/3001137
ID  - 3001137
ER  -