@misc{indiciae1cf877ac6ae1,
  title = {Multimodal Atomic Force Microscopy for the Characterization of Metallic Particulates},
  author = {Neu, Jenn [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034392349X) and Wood, Avery [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000224919228) and Moseley, Duncan [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000343518347) and Parish, Chad [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000312097439) and Miskowiec, Andrew [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000203612614) and Brubaker, Zach [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000256293119)},
  year = {2025},
  doi = {10.2172/3002152},
  url = {https://www.osti.gov/biblio/3002152},
  note = {Source identifier: 3002152}
}