@misc{indiciae5f9a5a495542,
  title = {Feasibility Assessment of Using Electrical Impedance Tomography for Damage Localization in Graphite Microreactor Components},
  author = {Raj, Anant [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000306711244) and Schreiber, Brandon [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000903896336) and Ramuhalli, Pradeep [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000163721743) and Petrie, Christian M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000311673545)},
  year = {2025},
  doi = {10.2172/3002240},
  url = {https://www.osti.gov/biblio/3002240},
  note = {Source identifier: 3002240}
}