@misc{indiciae650f9285146f,
  title = {Combining Deep Learning and scatterControl for High-Throughput X-ray CT Based Non-Destructive Characterization of Large-Scale Casted Metallic Components},
  author = {Ziabari, Amirkoushyar [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034776457X) and Bedhief, Mohamed Hakim [Carl ZEISS IMT GmbH, Oberkochen (Germany)] and Rahman, Obaidullah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000277810840) and Venkatakrishnan, Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000276374987) and Brackman, Paul [ZEISS Industrial Quality Solutions, Maple Grove, MN (United States)] and Katuch, Peter [Carl ZEISS IMT GmbH, Oberkochen (Germany)]},
  year = {2025},
  doi = {10.1007/s10921-025-01228-3},
  url = {https://www.osti.gov/biblio/3002416},
  note = {Source identifier: 3002416}
}