TY  - RPRT
TI  - Combining Deep Learning and scatterControl for High-Throughput X-ray CT Based Non-Destructive Characterization of Large-Scale Casted Metallic Components
AU  - Ziabari, Amirkoushyar [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000034776457X)
AU  - Bedhief, Mohamed Hakim [Carl ZEISS IMT GmbH, Oberkochen (Germany)]
AU  - Rahman, Obaidullah [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000277810840)
AU  - Venkatakrishnan, Singanallur [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000276374987)
AU  - Brackman, Paul [ZEISS Industrial Quality Solutions, Maple Grove, MN (United States)]
AU  - Katuch, Peter [Carl ZEISS IMT GmbH, Oberkochen (Germany)]
PY  - 2025
DO  - 10.1007/s10921-025-01228-3
UR  - https://www.osti.gov/biblio/3002416
ID  - 3002416
ER  -