@misc{indiciaecfe48f6385f3,
  title = {Elucidating Processes at Hard-Soft Interfaces in Next-Generation Electrochemical Devices by Cryogenic Electron Microscopy},
  author = {Zachman, Michael [ORNL] (ORCID:0000000319101357) and Oh, Juhyun [ORNL] (ORCID:0000000286051428) and Cullen, David A [ORNL] (ORCID:0000000225937866) and Sahore, Ritu [ORNL] (ORCID:0000000223909570) and Chen, Xi [ORNL] (ORCID:0000000311887658) and Wang, Xiaoping [Argonne National Laboratory (ANL)] and Myers, Deborah [Argonne National Laboratory (ANL)] and Ushizima, Daniela [Lawrence Berkeley National Laboratory (LBNL)] and Kwon, Obeen [University of California, Irvine] and Zenyuk, Iryna [University of California, Irvine]},
  year = {2025},
  doi = {10.1093/mam/ozaf048.654},
  url = {https://www.osti.gov/biblio/3002631},
  note = {Source identifier: 3002631}
}