@misc{indiciaedff1de0df67b,
  title = {Logical error rates for the surface code under a mixed coherent and stochastic circuit-level noise model inspired by trapped ions},
  author = {LeBlond, Tyler [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Quantinuum, Broomfield, CO (United States)] (ORCID:0000000306529485) and Groszkowski, Peter [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000174028653) and Lietz, Justin G. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); NVIDIA Corporation, Santa Clara, CA (United States)] (ORCID:0000000283985524) and Seck, Christopher M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000018789602X) and Bennink, Ryan S. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000248109369)},
  year = {2025},
  doi = {10.1103/ktb3-gcxr},
  url = {https://www.osti.gov/biblio/3004279},
  note = {Source identifier: 3004279}
}