TY  - RPRT
TI  - Logical error rates for the surface code under a mixed coherent and stochastic circuit-level noise model inspired by trapped ions
AU  - LeBlond, Tyler [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Quantinuum, Broomfield, CO (United States)] (ORCID:0000000306529485)
AU  - Groszkowski, Peter [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000174028653)
AU  - Lietz, Justin G. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); NVIDIA Corporation, Santa Clara, CA (United States)] (ORCID:0000000283985524)
AU  - Seck, Christopher M. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:000000018789602X)
AU  - Bennink, Ryan S. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000248109369)
PY  - 2025
DO  - 10.1103/ktb3-gcxr
UR  - https://www.osti.gov/biblio/3004279
ID  - 3004279
ER  -