@misc{indiciae2039c81d2e03,
  title = {Implementation of Johnson Noise Thermometry into Radiation Hardened Electronics},
  author = {Sweeney, Daniel C. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000212891627) and Reed, F. Kyle [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000222804574) and Ezell, N. Dianne Bull [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000193345822)},
  year = {2025},
  doi = {10.2172/3005423},
  url = {https://www.osti.gov/biblio/3005423},
  note = {Source identifier: 3005423}
}