TY  - RPRT
TI  - Implementation of Johnson Noise Thermometry into Radiation Hardened Electronics
AU  - Sweeney, Daniel C. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000212891627)
AU  - Reed, F. Kyle [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000222804574)
AU  - Ezell, N. Dianne Bull [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000193345822)
PY  - 2025
DO  - 10.2172/3005423
UR  - https://www.osti.gov/biblio/3005423
ID  - 3005423
ER  -