@misc{indiciaeec69d04d1d12,
  title = {Exponentially Reduced Circuit Depths Using Trotter Error Mitigation},
  author = {Watson, James D. [National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States); Univ. of Maryland, College Park, MD (United States)] (ORCID:0000000260774898) and Watkins, Jacob [Michigan State Univ., East Lansing, MI (United States); JP Morgan Chase (United States)] (ORCID:0000000314787230)},
  year = {2025},
  doi = {10.1103/kw39-yxq5},
  url = {https://www.osti.gov/biblio/3006232},
  note = {Source identifier: 3006232}
}