TY  - RPRT
TI  - Properties of Electronic Materials
AU  - Zhang, Shengbai [Rensselaer Polytechnic Inst., Troy, NY (United States)]
AU  - West, Damien [Rensselaer Polytechnic Inst., Troy, NY (United States)]
PY  - 2025
DO  - 10.2172/3006643
UR  - https://www.osti.gov/biblio/3006643
ID  - 3006643
ER  -