@misc{indiciae4a439e88c987,
  title = {Advanced Characterization in Advanced Manufacturing Workshop},
  author = {Pan, Shuaihang [Univ. of Utah, Salt Lake City, UT (United States)] (ORCID:000000025312992X) and Sprouster, David [Stony Brook Univ., NY (United States)] (ORCID:0000000226890721) and Zhang, Xijin [George Mason Univ., Fairfax, VA (United States)] (ORCID:0000000237046198) and Wu, Siyu [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000201995471) and Bernal Lopez, Miguel Tlahuilcol [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000186022582)},
  year = {2025},
  doi = {10.1080/08940886.2025.2579490},
  url = {https://www.osti.gov/biblio/3008072},
  note = {Source identifier: 3008072}
}