TY  - RPRT
TI  - Advanced Characterization in Advanced Manufacturing Workshop
AU  - Pan, Shuaihang [Univ. of Utah, Salt Lake City, UT (United States)] (ORCID:000000025312992X)
AU  - Sprouster, David [Stony Brook Univ., NY (United States)] (ORCID:0000000226890721)
AU  - Zhang, Xijin [George Mason Univ., Fairfax, VA (United States)] (ORCID:0000000237046198)
AU  - Wu, Siyu [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000201995471)
AU  - Bernal Lopez, Miguel Tlahuilcol [Brookhaven National Laboratory (BNL), Upton, NY (United States)] (ORCID:0000000186022582)
PY  - 2025
DO  - 10.1080/08940886.2025.2579490
UR  - https://www.osti.gov/biblio/3008072
ID  - 3008072
ER  -