TY  - RPRT
TI  - Understanding Surface Contamination Effects in Mid-T Baked Cavities
AU  - Chouhan, Vijay [Fermilab]
PY  - 2025
DO  - 10.2172/3008653
UR  - https://www.osti.gov/biblio/3008653
ID  - 3008653
ER  -