TY  - RPRT
TI  - Low two-level-system noise in hydrogenated amorphous silicon
AU  - Defrance, Fabien [California Institute of Technology, Pasadena, CA (United States)] (ORCID:0000000237465296)
AU  - Beyer, Andrew D. [California Institute of Technology, Pasadena, CA (United States)] (ORCID:0000000210451652)
AU  - Wheeler, Jordan [National Institute of Standards and Technology, Boulder, CO (United States)] (ORCID:0000000316785570)
AU  - Sayers, Jack [California Institute of Technology, Pasadena, CA (United States)] (ORCID:0000000282133784)
AU  - Golwala, Sunil R. [California Institute of Technology, Pasadena, CA (United States)] (ORCID:0000000210987174)
PY  - 2025
DO  - 10.1063/5.0255172
UR  - https://www.osti.gov/biblio/3010699
ID  - 3010699
ER  -