TY  - RPRT
TI  - Measuring the flatband potential in 2D semiconductors: Pitfalls and a possible SECCM solution
AU  - Chard, Ava R. [Colorado State University, Fort Collins, CO (United States)]
AU  - Sambur, Justin B. [Colorado State University, Fort Collins, CO (United States)] (ORCID:0000000284574946)
PY  - 2025
DO  - 10.1016/j.coelec.2025.101703
UR  - https://www.osti.gov/biblio/3010738
ID  - 3010738
ER  -