@misc{indiciae7ada937a3cf0,
  title = {Physics-informed machine learning analysis for nanoscale grain mapping by synchrotron Laue microdiffraction},
  author = {Chan, Ka Hung [Hong Kong University of Science and Technology (HKUST) (Hong Kong); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)] (ORCID:0000000337025124) and Huang, Xinyue [Hong Kong University of Science and Technology (HKUST) (Hong Kong)] and Tamura, Nobumichi [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)] (ORCID:0000000236982611) and Chen, Xian [Hong Kong University of Science and Technology (HKUST) (Hong Kong)] (ORCID:0000000201144642)},
  year = {2025},
  doi = {10.1107/s160057672500826x},
  url = {https://www.osti.gov/biblio/3013078},
  note = {Source identifier: 3013078}
}