TY  - RPRT
TI  - Physics-informed machine learning analysis for nanoscale grain mapping by synchrotron Laue microdiffraction
AU  - Chan, Ka Hung [Hong Kong University of Science and Technology (HKUST) (Hong Kong); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)] (ORCID:0000000337025124)
AU  - Huang, Xinyue [Hong Kong University of Science and Technology (HKUST) (Hong Kong)]
AU  - Tamura, Nobumichi [Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)] (ORCID:0000000236982611)
AU  - Chen, Xian [Hong Kong University of Science and Technology (HKUST) (Hong Kong)] (ORCID:0000000201144642)
PY  - 2025
DO  - 10.1107/s160057672500826x
UR  - https://www.osti.gov/biblio/3013078
ID  - 3013078
ER  -