@misc{indiciae28e20c2cafd7,
  title = {Microstructural Characterization of Nb\$\_3\$Sn Thin Films Using FIB Tomography},
  author = {Viklund, Eric [Fermilab] and Seidman, David [Fermilab] and Posen, Sam [Fermilab]},
  year = {2026},
  url = {https://www.osti.gov/biblio/3018265},
  note = {Source identifier: 3018265}
}