TY  - RPRT
TI  - Tutorial: Machine-Learning-Based CREASE-2D Analysis of 2D SAXS Profiles to Characterize Anisotropic Nanostructures in Soft Materials
AU  - Akepati, Sri Vishnuvardhan Reddy [University of Delaware, Newark, DE (United States)]
AU  - Gupta, Nitant [University of Delaware, Newark, DE (United States)] (ORCID:0000000237705587)
AU  - Shah, Jay [University of Delaware, Newark, DE (United States)] (ORCID:000000027576908X)
AU  - Kronenberger, Stephen [University of Delaware, Newark, DE (United States)] (ORCID:0000000270844060)
AU  - Venkat, Vaibhav [Westlake High School, Austin, TX (United States)]
AU  - Adhikari Sridhar, Rohan [University of Delaware, Newark, DE (United States)] (ORCID:0000000340969310)
AU  - Bianco, Simona [University of Glasgow (United Kingdom)]
AU  - Adams, Dave J. [University of Glasgow (United Kingdom)] (ORCID:0000000231761350)
AU  - Jayaraman, Arthi [University of Delaware, Newark, DE (United States)] (ORCID:0000000252954581)
PY  - 2025
DO  - 10.1021/acsmeasuresciau.5c00141
UR  - https://www.osti.gov/biblio/3019800
ID  - 3019800
ER  -