@misc{indiciaee1ced8a68ca9,
  title = {Interface chemistry informs about cathode and anode degradation during fast charging},
  author = {Bisht, Anuj [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000322258002) and Dixit, Marm [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000295999288) and Jafta, Charl J. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] and Mench, Matthew M. [Univ. of Tennessee, Knoxville, TN (United States)] and Kweon, Chol-Bum M. [US Dept. of Homeland Security (DHS), Aberdeen Proving Ground, MD (United States). DEVCOM Chemical Biological Center] and Belharouak, Ilias [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000239850278)},
  year = {2025},
  doi = {10.1016/j.jpowsour.2025.238977},
  url = {https://www.osti.gov/biblio/3020936},
  note = {Source identifier: 3020936}
}