TY  - RPRT
TI  - Interface chemistry informs about cathode and anode degradation during fast charging
AU  - Bisht, Anuj [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0009000322258002)
AU  - Dixit, Marm [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000295999288)
AU  - Jafta, Charl J. [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)]
AU  - Mench, Matthew M. [Univ. of Tennessee, Knoxville, TN (United States)]
AU  - Kweon, Chol-Bum M. [US Dept. of Homeland Security (DHS), Aberdeen Proving Ground, MD (United States). DEVCOM Chemical Biological Center]
AU  - Belharouak, Ilias [Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)] (ORCID:0000000239850278)
PY  - 2025
DO  - 10.1016/j.jpowsour.2025.238977
UR  - https://www.osti.gov/biblio/3020936
ID  - 3020936
ER  -