@misc{indiciae68fb0842929e,
  title = {Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM},
  author = {Ghosh, Supriya [University of Minnesota, Minneapolis, MN (United States)] and Liu, Fengdeng [University of Minnesota, Minneapolis, MN (United States)] and Nair, Sreejith [University of Minnesota, Minneapolis, MN (United States)] and Raj, Rishi [University of Minnesota, Minneapolis, MN (United States)] and Jalan, Bharat [University of Minnesota, Minneapolis, MN (United States)] and Mkhoyan, K. Andre [University of Minnesota, Minneapolis, MN (United States)] (ORCID:0000000335685452)},
  year = {2025},
  doi = {10.1016/j.ultramic.2025.114104},
  url = {https://www.osti.gov/biblio/3022083},
  note = {Source identifier: 3022083}
}