@misc{indiciae1565d974e1d9,
  title = {Interface morphology and dislocation-mediated processes during rapid solidification of thin films},
  author = {Nittala, Sammohith [McGill Univ., Montreal, QC (Canada)] (ORCID:0009000738864102) and Suviranta, Jaarli [McGill Univ., Montreal, QC (Canada)] (ORCID:000900053751160X) and Pinomaa, Tatu [VTT Technical Research Centre of Finland Ltd., Espoo (Finland)] and Voisin, Thomas [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)] and Burns, Duncan [Northwestern Univ., Evanston, IL (United States)] (ORCID:0000000203944117) and McKeown, Joseph T. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)] and Laukkanen, Anssi [VTT Technical Research Centre of Finland Ltd., Espoo (Finland)] and Provatas, Nikolas [McGill Univ., Montreal, QC (Canada)]},
  year = {2025},
  doi = {10.1016/j.actamat.2025.121581},
  url = {https://www.osti.gov/biblio/3022806},
  note = {Source identifier: 3022806}
}