TY  - RPRT
TI  - Interface morphology and dislocation-mediated processes during rapid solidification of thin films
AU  - Nittala, Sammohith [McGill Univ., Montreal, QC (Canada)] (ORCID:0009000738864102)
AU  - Suviranta, Jaarli [McGill Univ., Montreal, QC (Canada)] (ORCID:000900053751160X)
AU  - Pinomaa, Tatu [VTT Technical Research Centre of Finland Ltd., Espoo (Finland)]
AU  - Voisin, Thomas [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)]
AU  - Burns, Duncan [Northwestern Univ., Evanston, IL (United States)] (ORCID:0000000203944117)
AU  - McKeown, Joseph T. [Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)]
AU  - Laukkanen, Anssi [VTT Technical Research Centre of Finland Ltd., Espoo (Finland)]
AU  - Provatas, Nikolas [McGill Univ., Montreal, QC (Canada)]
PY  - 2025
DO  - 10.1016/j.actamat.2025.121581
UR  - https://www.osti.gov/biblio/3022806
ID  - 3022806
ER  -