TY  - RPRT
TI  - Pure edge-dislocation half-loops in low-temperature Ga⁢N for V-defect formation
AU  - Ewing, Jacob J.
AU  - Wu, Feng
AU  - Quevedo, Alejandro
AU  - Tak, Tanay
AU  - Nakamura, Shuji
AU  - DenBaars, Steven P.
AU  - Speck, James S.
PY  - 2024
DO  - 10.1103/physrevapplied.21.064042
UR  - https://www.osti.gov/biblio/3023028
ID  - 3023028
ER  -