@misc{indiciaeed62436a66b4,
  title = {Peering under the surface of semiconductors using scanning tunneling microscopy},
  author = {Misra, Shashank [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000170226994) and McCowan, Caitlin Victoria [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000209896187) and Sheridan, Thomas Robert [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000262474418) and Ivie, Jeffrey Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000198428475) and Anderson, Evan Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000237713085) and Campbell, Quinn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313773769) and Bussmann, Ezra [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000252852825) and Liang, Yunfan [Rensselaer Polytechnic Institute] and Zhang, Shengbai [Rensselaer Polytechnic Institute]},
  year = {2025},
  doi = {10.2172/3023891},
  url = {https://www.osti.gov/biblio/3023891},
  note = {Source identifier: 3023891}
}