TY  - RPRT
TI  - Peering under the surface of semiconductors using scanning tunneling microscopy
AU  - Misra, Shashank [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000170226994)
AU  - McCowan, Caitlin Victoria [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000209896187)
AU  - Sheridan, Thomas Robert [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000262474418)
AU  - Ivie, Jeffrey Andrew [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000198428475)
AU  - Anderson, Evan Michael [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000237713085)
AU  - Campbell, Quinn [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000313773769)
AU  - Bussmann, Ezra [Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)] (ORCID:0000000252852825)
AU  - Liang, Yunfan [Rensselaer Polytechnic Institute]
AU  - Zhang, Shengbai [Rensselaer Polytechnic Institute]
PY  - 2025
DO  - 10.2172/3023891
UR  - https://www.osti.gov/biblio/3023891
ID  - 3023891
ER  -